Genetic approaches to resistance to Fusarium and Bipolaris in wheat and barley

Abstract

This project provided information on the genetics of crown rot (CR) resistance to help breeding work, located new
parent lines in wheat and barley, and provided an insight into yield losses that occur in commercial varieties with increasing levels of CR for risk management. Genetic experiments found some highly resistant lines were poor parents, and CR resistance was complex. Best parent lines and many specific crosses were identified for further work.
New potential parent lines were identified in wheat and barley, some now used in breeding programs. Yield loss can
be severe even with low levels of CR when combined with drought stress. CR can reduce yield even with a wet finish.